The federation
Intranet
Scanning electron microscope
Non-destructive solid characterization technique. Allowing the identification and relative quantification of crystalline phases.
| MEB | Vega3 Tescan | |
|---|---|---|
| Framework of use | Accessible mineralogy team apparatus | |
| Elements analysed | Chemical characterization or imaging | |
| Technical specifications | Technical data : | Controlled vacuum conventional scanning electron microscope Voltage from 5kV to 30KV Secondary and backscattered electron detectors. Cathodoluminescence detector monochromatic. STEM detector. SDD XRay detector 30mm2. |
| Possible types of analyses : | Characterization, semi-quantitative chemical analysis, image processing for quantification of the different phases | |
| Persons in charge of the tool
Associate team |
Scientific Manager : 04 76 63 52 00 Technical Manager : 04 76 51 40 78 | |
RESERVATIONS
– Monday, Tuesday : non-autonomous users
Half day booking : 8am-12.30pm / 1pm-4.30pm
– Wednesday to Friday : independent users
Half day booking : 8am-1pm / from 1pm
Daytime possible depending on availability
To book, send an email to Rachel Martin
Possible reservation from :