X-ray diffraction

Non-destructive solid characterization technique. Allowing the identification and relative quantification of crystalline phases.

Diffraction X	Siemens D5000 and Bruker Axs D8
Framework of use	Accessible mineralogy team apparatus
Elements analysed	Mineralogical or structural characterization
Technical specifications	Technical data :	Goniometer equipped with rotating sample holder, capillary, controlled environment chamber Cobalt, Copper or Molybdenum tubes Tetha-tetha goniometers with accuracy of 0.002 degrees SolXE and solX detectors resolved in energy
	Possible types of analyses :	Characterization, quantitative analysis by rietveld refinement, study and modelling of oriented deposition (clays)
Persons in charge of the tool Associate team	Scientific manager : – Dr. Bruno Lanson 04 76 63 51 95 Technical manager : – Nathaniel Findling 04 76 51 40 78